%0 Conference Paper %1 conf/essderc/JaussSDNA15 %A Jauss, S. A. %A Schwaiger, S. %A Daves, W. %A Noll, S. %A Ambacher, O. %B ESSDERC %D 2015 %I IEEE %K dblp %P 56-59 %T Charge trapping in gate-drain access region of AlGaN/GaN MIS-HEMTs after drain stress. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#JaussSDNA15 %@ 978-1-4673-7135-3

@inproceedings{conf/essderc/JaussSDNA15, added-at = {2017-05-19T00:00:00.000+0200}, author = {Jauss, S. A. and Schwaiger, S. and Daves, W. and Noll, S. and Ambacher, O.}, biburl = {https://www.bibsonomy.org/bibtex/25f2317dd4237e51ba8b97b654b1e530c/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2015}, ee = {https://doi.org/10.1109/ESSDERC.2015.7324712}, interhash = {e090f1d27c762b0072305e47fa8f5306}, intrahash = {5f2317dd4237e51ba8b97b654b1e530c}, isbn = {978-1-4673-7135-3}, keywords = {dblp}, pages = {56-59}, publisher = {IEEE}, timestamp = {2019-10-17T12:39:51.000+0200}, title = {Charge trapping in gate-drain access region of AlGaN/GaN MIS-HEMTs after drain stress.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#JaussSDNA15}, year = 2015 }