%0 Conference Paper %1 conf/vlsid/SrinivasJA95 %A Srinivas, Mandyam-Komar %A Jacob, James %A Agrawal, Vishwani D. %B VLSI Design %D 1995 %I IEEE Computer Society %K dblp %P 47-52 %T Functional test generation for non-scan sequential circuits. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#SrinivasJA95 %@ 0-8186-6905-5

@inproceedings{conf/vlsid/SrinivasJA95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Srinivas, Mandyam-Komar and Jacob, James and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/2bcd21553f6d39da222e8566f63b232ce/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512076}, interhash = {e2c237912cf5bcf9b2b2ff24fdd3c22f}, intrahash = {bcd21553f6d39da222e8566f63b232ce}, isbn = {0-8186-6905-5}, keywords = {dblp}, pages = {47-52}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:46:44.000+0200}, title = {Functional test generation for non-scan sequential circuits.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#SrinivasJA95}, year = 1995 }