%0 Journal Article %1 journals/mr/LiouZMTSL02 %A Liou, Juin J. %A Zhang, Qiang %A McMacken, John %A Thomson, J. Ross %A Stiles, Kevin %A Layman, Paul %D 2002 %J Microelectron. Reliab. %K %N 4-5 %P 787-795 %T Statistical modeling of MOS devices for parametric yield prediction. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#LiouZMTSL02 %V 42

@article{journals/mr/LiouZMTSL02, added-at = {2023-12-14T14:53:11.000+0100}, author = {Liou, Juin J. and Zhang, Qiang and McMacken, John and Thomson, J. Ross and Stiles, Kevin and Layman, Paul}, biburl = {https://www.bibsonomy.org/bibtex/2e1f58a4087c4a6a368d1a746115ae919/admin}, ee = {https://doi.org/10.1016/S0026-2714(01)00262-1}, interhash = {e464979fc51491f9d5ffe4cd7e595303}, intrahash = {e1f58a4087c4a6a368d1a746115ae919}, journal = {Microelectron. Reliab.}, keywords = {}, number = {4-5}, pages = {787-795}, timestamp = {2023-12-14T14:53:11.000+0100}, title = {Statistical modeling of MOS devices for parametric yield prediction.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#LiouZMTSL02}, volume = 42, year = 2002 }