%0 Journal Article %1 journals/mr/TestaCRPT11 %A Testa, Antonio %A Caro, Salvatore De %A Russo, Sebastiano %A Patti, D. %A Torrisi, Lucia %D 2011 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1778-1782 %T High temperature long term stability of SiC Schottky diodes. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#TestaCRPT11 %V 51

@article{journals/mr/TestaCRPT11, added-at = {2020-03-24T00:00:00.000+0100}, author = {Testa, Antonio and Caro, Salvatore De and Russo, Sebastiano and Patti, D. and Torrisi, Lucia}, biburl = {https://www.bibsonomy.org/bibtex/2dc324189595a8ec5ac187f4ecd16090e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.07.026}, interhash = {e47a2999c7ba63829cc97b722ea22352}, intrahash = {dc324189595a8ec5ac187f4ecd16090e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1778-1782}, timestamp = {2020-03-25T11:49:39.000+0100}, title = {High temperature long term stability of SiC Schottky diodes.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#TestaCRPT11}, volume = 51, year = 2011 }