%0 Conference Paper %1 conf/ats/Lubaszewski98 %A Lubaszewski, Marcelo %B Asian Test Symposium %D 1998 %I IEEE Computer Society %K dblp %P 513 %T Bridging the Gap between Microelectronics and Micromechanics Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats1998.html#Lubaszewski98 %@ 0-8186-8277-9

@inproceedings{conf/ats/Lubaszewski98, added-at = {2023-03-24T00:00:00.000+0100}, author = {Lubaszewski, Marcelo}, biburl = {https://www.bibsonomy.org/bibtex/2a0c25c0eb9e867fa3be8f26a1f850fa9/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1998}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1998.741667}, interhash = {e5d30cd88e90944eef788ee86b98ec89}, intrahash = {a0c25c0eb9e867fa3be8f26a1f850fa9}, isbn = {0-8186-8277-9}, keywords = {dblp}, pages = 513, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:24.000+0200}, title = {Bridging the Gap between Microelectronics and Micromechanics Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1998.html#Lubaszewski98}, year = 1998 }