%0 Conference Paper %1 conf/itc/MalyFS84 %A Maly, Wojciech %A Ferguson, F. Joel %A Shen, John Paul %B ITC %D 1984 %I IEEE Computer Society %K dblp %P 390-399 %T Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells. %U http://dblp.uni-trier.de/db/conf/itc/itc1984.html#MalyFS84

@inproceedings{conf/itc/MalyFS84, added-at = {2002-11-22T00:00:00.000+0100}, author = {Maly, Wojciech and Ferguson, F. Joel and Shen, John Paul}, biburl = {https://www.bibsonomy.org/bibtex/291c0fa44469ec31422c269200938202c/dblp}, booktitle = {ITC}, crossref = {conf/itc/1984}, date = {2002-11-22}, description = {dblp}, interhash = {e7632718de998abd892cc880bfafe7fc}, intrahash = {91c0fa44469ec31422c269200938202c}, keywords = {dblp}, pages = {390-399}, publisher = {IEEE Computer Society}, timestamp = {2002-11-22T00:00:00.000+0100}, title = {Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1984.html#MalyFS84}, year = 1984 }