%0 Journal Article %1 journals/mr/ChenAKLM12 %A Chen, Chang-Chih %A Ahmed, Fahad %A Kim, Dae Hyun %A Lim, Sung Kyu %A Milor, Linda %D 2012 %J Microelectron. Reliab. %K %N 9-10 %P 1953-1959 %T Backend dielectric reliability simulator for microprocessor system. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#ChenAKLM12 %V 52

@article{journals/mr/ChenAKLM12, added-at = {2023-12-14T15:07:45.000+0100}, author = {Chen, Chang-Chih and Ahmed, Fahad and Kim, Dae Hyun and Lim, Sung Kyu and Milor, Linda}, biburl = {https://www.bibsonomy.org/bibtex/2c6e5f333bca7d30c01898953e42843cf/admin}, ee = {https://doi.org/10.1016/j.microrel.2012.07.002}, interhash = {e7861b9a08993269432edd0e9e64319f}, intrahash = {c6e5f333bca7d30c01898953e42843cf}, journal = {Microelectron. Reliab.}, keywords = {}, number = {9-10}, pages = {1953-1959}, timestamp = {2023-12-14T15:07:45.000+0100}, title = {Backend dielectric reliability simulator for microprocessor system.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#ChenAKLM12}, volume = 52, year = 2012 }