%0 Journal Article %1 journals/mr/StojadinovicMDDDGD02 %A Stojadinovic, Ninoslav %A Manic, Ivica %A Djoric-Veljkovic, Snezana %A Davidovic, Vojkan %A Dankovic, Danijel %A Golubovic, Snezana %A Dimitrijev, Sima %D 2002 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1465-1468 %T Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#StojadinovicMDDDGD02 %V 42

@article{journals/mr/StojadinovicMDDDGD02, added-at = {2024-02-05T00:00:00.000+0100}, author = {Stojadinovic, Ninoslav and Manic, Ivica and Djoric-Veljkovic, Snezana and Davidovic, Vojkan and Dankovic, Danijel and Golubovic, Snezana and Dimitrijev, Sima}, biburl = {https://www.bibsonomy.org/bibtex/229478aeedbd43d30dc5a8af19d80e289/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00171-3}, interhash = {e94b97707be9efc8a0957f8ebe860536}, intrahash = {29478aeedbd43d30dc5a8af19d80e289}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1465-1468}, timestamp = {2024-04-09T02:49:51.000+0200}, title = {Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#StojadinovicMDDDGD02}, volume = 42, year = 2002 }