%0 Journal Article %1 journals/mr/LeeHYP15 %A Lee, Jae Hoon %A Han, Jin-Woo %A Yu, Chong-Gun %A Park, Jong Tae %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1456-1459 %T Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#LeeHYP15 %V 55

@article{journals/mr/LeeHYP15, added-at = {2022-10-02T00:00:00.000+0200}, author = {Lee, Jae Hoon and Han, Jin-Woo and Yu, Chong-Gun and Park, Jong Tae}, biburl = {https://www.bibsonomy.org/bibtex/2b248758f17e9e75070a06e36f68548a0/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.062}, interhash = {eb93088de1b5b9e31c5928f999280bb4}, intrahash = {b248758f17e9e75070a06e36f68548a0}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1456-1459}, timestamp = {2024-04-09T02:49:51.000+0200}, title = {Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#LeeHYP15}, volume = 55, year = 2015 }