%0 Journal Article %1 journals/iet-cds/MukherjeeRDS16 %A Mukherjee, Sagar %A Roy, Swarnil %A Dutta, Arka %A Sarkar, Chandan Kumar %D 2016 %J IET Circuits Devices Syst. %K dblp %N 6 %P 497-503 %T Study on effect of back oxide thickness variation in FDSOI MOSFET on analogue circuit performance. %U http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds10.html#MukherjeeRDS16 %V 10

@article{journals/iet-cds/MukherjeeRDS16, added-at = {2022-10-02T00:00:00.000+0200}, author = {Mukherjee, Sagar and Roy, Swarnil and Dutta, Arka and Sarkar, Chandan Kumar}, biburl = {https://www.bibsonomy.org/bibtex/20f458966d79ed0b2b2afd95697325c85/dblp}, ee = {https://doi.org/10.1049/iet-cds.2016.0234}, interhash = {ec1cf8c40a40a084895f0424eeeac0ac}, intrahash = {0f458966d79ed0b2b2afd95697325c85}, journal = {IET Circuits Devices Syst.}, keywords = {dblp}, number = 6, pages = {497-503}, timestamp = {2024-04-08T16:07:25.000+0200}, title = {Study on effect of back oxide thickness variation in FDSOI MOSFET on analogue circuit performance.}, url = {http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds10.html#MukherjeeRDS16}, volume = 10, year = 2016 }