%0 Journal Article %1 journals/mr/HuangFL18 %A Huang, Guo-Lun %A Fu, Wei-Hao %A Lin, Chun-Yu %D 2018 %J Microelectron. Reliab. %K dblp %P 271-280 %T Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology. %U http://dblp.uni-trier.de/db/journals/mr/mr83.html#HuangFL18 %V 83

@article{journals/mr/HuangFL18, added-at = {2022-05-04T00:00:00.000+0200}, author = {Huang, Guo-Lun and Fu, Wei-Hao and Lin, Chun-Yu}, biburl = {https://www.bibsonomy.org/bibtex/24e9812c3a9155ab5f7014e4140f7554e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.06.068}, interhash = {effa17087afae4782b5a0b2b1fed6a1c}, intrahash = {4e9812c3a9155ab5f7014e4140f7554e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {271-280}, timestamp = {2024-04-09T02:49:51.000+0200}, title = {Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr83.html#HuangFL18}, volume = 83, year = 2018 }