%0 Journal Article %1 journals/mr/StangoniCF03 %A Stangoni, Maria %A Ciappa, Mauro %A Fichtner, Wolfgang %D 2003 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1651-1656 %T A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#StangoniCF03 %V 43

@article{journals/mr/StangoniCF03, added-at = {2020-02-22T00:00:00.000+0100}, author = {Stangoni, Maria and Ciappa, Mauro and Fichtner, Wolfgang}, biburl = {https://www.bibsonomy.org/bibtex/2b3ba86871290e461ab236ac1af1bbeb9/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00293-2}, interhash = {f0b8831accf597b015271ef088bd7a04}, intrahash = {b3ba86871290e461ab236ac1af1bbeb9}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1651-1656}, timestamp = {2020-02-25T13:25:01.000+0100}, title = {A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#StangoniCF03}, volume = 43, year = 2003 }