%0 Conference Paper %1 conf/aspdac/McDougallPJZZPA03 %A McDougall, Tim %A Parashkevov, Atanas N. %A Jolly, Simon %A Zhu, Juhong %A Zeng, Jing %A Pyron, Carol %A Abadir, Magdy S. %B ASP-DAC %D 2003 %E Yasuura, Hiroto %I ACM %K dblp %P 769-774 %T An automated method for test model generation from switch level circuits. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2003.html#McDougallPJZZPA03 %@ 0-7803-7660-9

@inproceedings{conf/aspdac/McDougallPJZZPA03, added-at = {2018-11-06T00:00:00.000+0100}, author = {McDougall, Tim and Parashkevov, Atanas N. and Jolly, Simon and Zhu, Juhong and Zeng, Jing and Pyron, Carol and Abadir, Magdy S.}, biburl = {https://www.bibsonomy.org/bibtex/2cf14ff75c1f5d586438937bd439543e6/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2003}, editor = {Yasuura, Hiroto}, ee = {https://doi.org/10.1145/1119772.1119943}, interhash = {f0ba340aa40abba7ff2453bd8240f485}, intrahash = {cf14ff75c1f5d586438937bd439543e6}, isbn = {0-7803-7660-9}, keywords = {dblp}, pages = {769-774}, publisher = {ACM}, timestamp = {2024-04-09T13:32:55.000+0200}, title = {An automated method for test model generation from switch level circuits.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2003.html#McDougallPJZZPA03}, year = 2003 }