%0 Conference Paper %1 conf/islped/MukhopadhyayKCR05 %A Mukhopadhyay, Saibal %A Kim, Keunwoo %A Chuang, Ching-Te %A Roy, Kaushik %B ISLPED %D 2005 %E Roy, Kaushik %E Tiwari, Vivek %I ACM %K dblp %P 8-13 %T Modeling and analysis of total leakage currents in nanoscale double gate devices and circuits. %U http://dblp.uni-trier.de/db/conf/islped/islped2005.html#MukhopadhyayKCR05 %@ 1-59593-137-6

@inproceedings{conf/islped/MukhopadhyayKCR05, added-at = {2018-11-06T00:00:00.000+0100}, author = {Mukhopadhyay, Saibal and Kim, Keunwoo and Chuang, Ching-Te and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/211d771c4606cbdbcc9dad184f8bbb140/dblp}, booktitle = {ISLPED}, crossref = {conf/islped/2005}, editor = {Roy, Kaushik and Tiwari, Vivek}, ee = {https://doi.org/10.1145/1077603.1077608}, interhash = {f33da339d6b9d599b296a3dcf3e31ed1}, intrahash = {11d771c4606cbdbcc9dad184f8bbb140}, isbn = {1-59593-137-6}, keywords = {dblp}, pages = {8-13}, publisher = {ACM}, timestamp = {2018-11-07T16:25:08.000+0100}, title = {Modeling and analysis of total leakage currents in nanoscale double gate devices and circuits.}, url = {http://dblp.uni-trier.de/db/conf/islped/islped2005.html#MukhopadhyayKCR05}, year = 2005 }