%0 Journal Article %1 journals/mr/MoonLYNPY13 %A Moon, Pyung %A Lim, Jun Yeong %A Youn, Tae-Un %A Noh, Keum-Whan %A Park, Sung-Kye %A Yun, Ilgu %D 2013 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1338-1341 %T Methodology for improvement of data retention in floating gate flash memory using leakage current estimation. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#MoonLYNPY13 %V 53

@article{journals/mr/MoonLYNPY13, added-at = {2020-02-22T00:00:00.000+0100}, author = {Moon, Pyung and Lim, Jun Yeong and Youn, Tae-Un and Noh, Keum-Whan and Park, Sung-Kye and Yun, Ilgu}, biburl = {https://www.bibsonomy.org/bibtex/274f5457c7ed7e99f81bb8da5c11d57f3/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.07.007}, interhash = {f653996aecf21bd971138cc4b3c78bd7}, intrahash = {74f5457c7ed7e99f81bb8da5c11d57f3}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1338-1341}, timestamp = {2020-02-25T13:24:54.000+0100}, title = {Methodology for improvement of data retention in floating gate flash memory using leakage current estimation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#MoonLYNPY13}, volume = 53, year = 2013 }