Article,
Affordable and Comprehensive Testing of 3-D Stacked Die Devices.
J. Côté, J. Fan, S. Shen, G. Danialy, M. Lipinski, M. Garbers, W. Yang, M. Keim, A. Glowatz, J. Reynick, A. Patel, and J. Michna.IEEE Des. Test, 39 (5): 17-25 (2022)
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- article
- year
- 2022
- journal
- IEEE Des. Test
- number
- 5
- pages
- 17-25
- volume
- 39
- ee
- https://doi.org/10.1109/MDAT.2022.3191016
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- http://dblp.uni-trier.de/db/journals/dt/dt39.html#CoteFSDLGYKGRPM22
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- please select -%0 Journal Article
%1 journals/dt/CoteFSDLGYKGRPM22
%A Côté, Jean-François
%A Fan, Jeff
%A Shen, Sean
%A Danialy, Givargis
%A Lipinski, Marcin
%A Garbers, Michael
%A Yang, Wu
%A Keim, Martin
%A Glowatz, Andreas
%A Reynick, Joe
%A Patel, Ayush
%A Michna, Joanna
%D 2022
%J IEEE Des. Test
%K dblp
%N 5
%P 17-25
%T Affordable and Comprehensive Testing of 3-D Stacked Die Devices.
%U http://dblp.uni-trier.de/db/journals/dt/dt39.html#CoteFSDLGYKGRPM22
%V 39
@article{journals/dt/CoteFSDLGYKGRPM22,
added-at = {2022-10-18T00:00:00.000+0200},
author = {Côté, Jean-François and Fan, Jeff and Shen, Sean and Danialy, Givargis and Lipinski, Marcin and Garbers, Michael and Yang, Wu and Keim, Martin and Glowatz, Andreas and Reynick, Joe and Patel, Ayush and Michna, Joanna},
biburl = {https://www.bibsonomy.org/bibtex/29e65bd24c215b61578226d743e9ff0f0/dblp},
ee = {https://doi.org/10.1109/MDAT.2022.3191016},
interhash = {f6e3d7e84afa54d8e02d84c0f8bbe45b},
intrahash = {9e65bd24c215b61578226d743e9ff0f0},
journal = {IEEE Des. Test},
keywords = {dblp},
number = 5,
pages = {17-25},
timestamp = {2024-04-09T04:12:51.000+0200},
title = {Affordable and Comprehensive Testing of 3-D Stacked Die Devices.},
url = {http://dblp.uni-trier.de/db/journals/dt/dt39.html#CoteFSDLGYKGRPM22},
volume = 39,
year = 2022
}