%0 Conference Paper %1 conf/itc/LiWG20 %A Li, Mingye %A Wang, Fangzhou %A Gupta, Sandeep %B ITC %D 2020 %I IEEE %K dblp %P 1-5 %T Data-driven fault model development for superconducting logic. %U http://dblp.uni-trier.de/db/conf/itc/itc2020.html#LiWG20 %@ 978-1-7281-9113-3

@inproceedings{conf/itc/LiWG20, added-at = {2023-09-26T00:00:00.000+0200}, author = {Li, Mingye and Wang, Fangzhou and Gupta, Sandeep}, biburl = {https://www.bibsonomy.org/bibtex/234b77006377eaaf334b8208a75f97b5b/dblp}, booktitle = {ITC}, crossref = {conf/itc/2020}, ee = {https://doi.org/10.1109/ITC44778.2020.9325220}, interhash = {f7e7cfdec1dc89dec835bc709776ddf9}, intrahash = {34b77006377eaaf334b8208a75f97b5b}, isbn = {978-1-7281-9113-3}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-04-10T00:23:05.000+0200}, title = {Data-driven fault model development for superconducting logic.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2020.html#LiWG20}, year = 2020 }