%0 Conference Paper %1 conf/ftcs/UppaluriPR94 %A Uppaluri, Prasanti %A Pomeranz, Irith %A Reddy, Sudhakar M. %B FTCS %D 1994 %I IEEE Computer Society %K dblp %P 456-465 %T Test Pattern Generation for Path Delay Faults in Synchronous Sequential Circuits Using Multiple Fast Clocks and Multiple Observations Times. %U http://dblp.uni-trier.de/db/conf/ftcs/ftcs94.html#UppaluriPR94 %@ 0-8186-5520-8

@inproceedings{conf/ftcs/UppaluriPR94, added-at = {2017-05-23T00:00:00.000+0200}, author = {Uppaluri, Prasanti and Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/22fb7349c3b97196872c5cf649aaffb5e/dblp}, booktitle = {FTCS}, crossref = {conf/ftcs/1994}, ee = {https://doi.org/10.1109/FTCS.1994.315617}, interhash = {fa118591eacb3585e14821712d853f2e}, intrahash = {2fb7349c3b97196872c5cf649aaffb5e}, isbn = {0-8186-5520-8}, keywords = {dblp}, pages = {456-465}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T13:31:07.000+0200}, title = {Test Pattern Generation for Path Delay Faults in Synchronous Sequential Circuits Using Multiple Fast Clocks and Multiple Observations Times.}, url = {http://dblp.uni-trier.de/db/conf/ftcs/ftcs94.html#UppaluriPR94}, year = 1994 }