%0 Journal Article %1 journals/tcad/PomeranzR00a %A Pomeranz, Irith %A Reddy, Sudhakar M. %D 2000 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 5 %P 589-600 %T A diagnostic test generation procedure based on test elimination byvector omission for synchronous sequential circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad19.html#PomeranzR00a %V 19

@article{journals/tcad/PomeranzR00a, added-at = {2020-09-24T00:00:00.000+0200}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2484479d8cd52268c3baf517a72d206a2/dblp}, ee = {https://doi.org/10.1109/43.845083}, interhash = {fa83c6979e0a5e4059f2649ad6b151ce}, intrahash = {484479d8cd52268c3baf517a72d206a2}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 5, pages = {589-600}, timestamp = {2020-09-25T11:45:28.000+0200}, title = {A diagnostic test generation procedure based on test elimination byvector omission for synchronous sequential circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad19.html#PomeranzR00a}, volume = 19, year = 2000 }