%0 Journal Article %1 journals/tse/ParrishZ95 %A Parrish, Allen S. %A Zweben, Stuart H. %D 1995 %J IEEE Trans. Software Eng. %K dblp %N 12 %P 1006-1009 %T On the Relationships Among the All-Uses, All-DU-Paths, and All-Edges Testing Criteria. %U http://dblp.uni-trier.de/db/journals/tse/tse21.html#ParrishZ95 %V 21

@article{journals/tse/ParrishZ95, added-at = {2015-12-10T00:00:00.000+0100}, author = {Parrish, Allen S. and Zweben, Stuart H.}, biburl = {https://www.bibsonomy.org/bibtex/2fa96adb28046530874b594bdf6f4944a/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/32.489075}, interhash = {fb85f691cc2d90c3434f0a7ceb8d6de2}, intrahash = {fa96adb28046530874b594bdf6f4944a}, journal = {IEEE Trans. Software Eng.}, keywords = {dblp}, number = 12, pages = {1006-1009}, timestamp = {2015-12-12T11:53:11.000+0100}, title = {On the Relationships Among the All-Uses, All-DU-Paths, and All-Edges Testing Criteria.}, url = {http://dblp.uni-trier.de/db/journals/tse/tse21.html#ParrishZ95}, volume = 21, year = 1995 }