%0 Conference Paper %1 conf/ats/Kerkhoff98 %A Kerkhoff, Hans G. %B Asian Test Symposium %D 1998 %I IEEE Computer Society %K dblp %P 510-511 %T Microsystem Testing: Challenge or Common Knowledge? %U http://dblp.uni-trier.de/db/conf/ats/ats1998.html#Kerkhoff98 %@ 0-8186-8277-9

@inproceedings{conf/ats/Kerkhoff98, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kerkhoff, Hans G.}, biburl = {https://www.bibsonomy.org/bibtex/2a2bb6f25ffa6d839a1f95b298c0edf54/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1998}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1998.741665}, interhash = {fc6b5401ddb3de86378281ff8dddb9e2}, intrahash = {a2bb6f25ffa6d839a1f95b298c0edf54}, isbn = {0-8186-8277-9}, keywords = {dblp}, pages = {510-511}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:24.000+0200}, title = {Microsystem Testing: Challenge or Common Knowledge?}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1998.html#Kerkhoff98}, year = 1998 }