%0 Journal Article %1 journals/tcasI/KumarCTCA23 %A Kumar, Shubham %A Chatterjee, Swetaki %A Thomann, Simon %A Chauhan, Yogesh Singh %A Amrouch, Hussam %D 2023 %J IEEE Trans. Circuits Syst. I Regul. Pap. %K dblp %N 7 %P 2891-2903 %T Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction. %U http://dblp.uni-trier.de/db/journals/tcasI/tcasI70.html#KumarCTCA23 %V 70

@article{journals/tcasI/KumarCTCA23, added-at = {2023-07-13T00:00:00.000+0200}, author = {Kumar, Shubham and Chatterjee, Swetaki and Thomann, Simon and Chauhan, Yogesh Singh and Amrouch, Hussam}, biburl = {https://www.bibsonomy.org/bibtex/212cb5d15b5482ed70ae315df8760c8da/dblp}, ee = {https://doi.org/10.1109/TCSI.2023.3265427}, interhash = {fc83be58f2f34af3e18d3af474e1031b}, intrahash = {12cb5d15b5482ed70ae315df8760c8da}, journal = {IEEE Trans. Circuits Syst. I Regul. Pap.}, keywords = {dblp}, month = {July}, number = 7, pages = {2891-2903}, timestamp = {2024-04-08T16:47:55.000+0200}, title = {Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction.}, url = {http://dblp.uni-trier.de/db/journals/tcasI/tcasI70.html#KumarCTCA23}, volume = 70, year = 2023 }