%0 Journal Article %1 journals/mr/AzouiTDRMP13 %A Azoui, Toufik %A Tounsi, Patrick %A Dorkel, Jean-Marie %A Reynes, Jean-Michel %A Massol, Jean-Luc %A Pomes, E. %D 2013 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1750-1754 %T Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#AzouiTDRMP13 %V 53

@article{journals/mr/AzouiTDRMP13, added-at = {2020-02-22T00:00:00.000+0100}, author = {Azoui, Toufik and Tounsi, Patrick and Dorkel, Jean-Marie and Reynes, Jean-Michel and Massol, Jean-Luc and Pomes, E.}, biburl = {https://www.bibsonomy.org/bibtex/26b5d13794b2e46fbcd46f323b682b7e9/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.07.127}, interhash = {fd2f4a4518fd2de75c7e31161806eca6}, intrahash = {6b5d13794b2e46fbcd46f323b682b7e9}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1750-1754}, timestamp = {2020-02-25T13:30:02.000+0100}, title = {Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#AzouiTDRMP13}, volume = 53, year = 2013 }