%0 Conference Paper %1 conf/euromicro/BevacquaGF96 %A Bevacqua, Roberto %A Guerrazzi, Luca %A Fummi, Franco %B EUROMICRO %D 1996 %I IEEE Computer Society %K dblp %P 351- %T SCAN/BIST Techniques for Decreasing Test Storage and their implications to Test Pattern Generation. %U http://dblp.uni-trier.de/db/conf/euromicro/euromicro1996.html#BevacquaGF96 %@ 0-8186-7487-3

@inproceedings{conf/euromicro/BevacquaGF96, added-at = {2023-03-24T00:00:00.000+0100}, author = {Bevacqua, Roberto and Guerrazzi, Luca and Fummi, Franco}, biburl = {https://www.bibsonomy.org/bibtex/295f6c86486a75c552aba4e3dc7ad967a/dblp}, booktitle = {EUROMICRO}, crossref = {conf/euromicro/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/EURMIC.1996.546458}, interhash = {fd5d43b28fb9258984c06fb56f8d9a4b}, intrahash = {95f6c86486a75c552aba4e3dc7ad967a}, isbn = {0-8186-7487-3}, keywords = {dblp}, pages = {351-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:02:38.000+0200}, title = {SCAN/BIST Techniques for Decreasing Test Storage and their implications to Test Pattern Generation.}, url = {http://dblp.uni-trier.de/db/conf/euromicro/euromicro1996.html#BevacquaGF96}, year = 1996 }