%0 Conference Paper %1 conf/ats/LeeHA04 %A soo Lee, Il %A Hur, Yong Min %A Ambler, Tony %B Asian Test Symposium %D 2004 %I IEEE Computer Society %K dblp %P 94-97 %T The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. %U http://dblp.uni-trier.de/db/conf/ats/ats2004.html#LeeHA04 %@ 0-7695-2235-1

@inproceedings{conf/ats/LeeHA04, added-at = {2023-03-24T00:00:00.000+0100}, author = {soo Lee, Il and Hur, Yong Min and Ambler, Tony}, biburl = {https://www.bibsonomy.org/bibtex/2c877aa53373ba0ae427669d89c00e152/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2004.85}, interhash = {feed06db6a1baa310cdf0545fc596bcf}, intrahash = {c877aa53373ba0ae427669d89c00e152}, isbn = {0-7695-2235-1}, keywords = {dblp}, pages = {94-97}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:57.000+0200}, title = {The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2004.html#LeeHA04}, year = 2004 }