%0 Journal Article %1 journals/mr/YehL16 %A Yeh, Meng-Kao %A Lu, Chun-Lin %D 2016 %J Microelectron. Reliab. %K dblp %P 111-119 %T Reliability analysis of 3D heterogeneous microsystem module by simplified finite element model. %U http://dblp.uni-trier.de/db/journals/mr/mr63.html#YehL16 %V 63

@article{journals/mr/YehL16, added-at = {2020-02-22T00:00:00.000+0100}, author = {Yeh, Meng-Kao and Lu, Chun-Lin}, biburl = {https://www.bibsonomy.org/bibtex/2bdbaf99e6305b3ab9f073358d6ad5333/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.06.001}, interhash = {ff38da50a15a27b02bb3936c66819887}, intrahash = {bdbaf99e6305b3ab9f073358d6ad5333}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {111-119}, timestamp = {2020-02-25T13:25:30.000+0100}, title = {Reliability analysis of 3D heterogeneous microsystem module by simplified finite element model.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr63.html#YehL16}, volume = 63, year = 2016 }