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%0 Conference Paper
%1 conf/fpl/AhmedZTB16
%A Ahmed, Ibrahim
%A Zhao, Shuze
%A Trescases, Olivier
%A Betz, Vaughn
%B FPL
%D 2016
%E Ienne, Paolo
%E Najjar, Walid A.
%E Anderson, Jason Helge
%E Brisk, Philip
%E Stechele, Walter
%I IEEE
%K dblp
%P 1-11
%T Measure twice and cut once: Robust dynamic voltage scaling for FPGAs.
%U http://dblp.uni-trier.de/db/conf/fpl/fpl2016.html#AhmedZTB16
%@ 978-2-8399-1844-2
@inproceedings{conf/fpl/AhmedZTB16,
added-at = {2019-02-18T00:00:00.000+0100},
author = {Ahmed, Ibrahim and Zhao, Shuze and Trescases, Olivier and Betz, Vaughn},
biburl = {https://www.bibsonomy.org/bibtex/2a86f2927086bc9a832f3a38bc1ba6838/dblp},
booktitle = {FPL},
crossref = {conf/fpl/2016},
editor = {Ienne, Paolo and Najjar, Walid A. and Anderson, Jason Helge and Brisk, Philip and Stechele, Walter},
ee = {https://doi.org/10.1109/FPL.2016.7577342},
interhash = {ffb566e0ff182da471f40b6b2a5324a8},
intrahash = {a86f2927086bc9a832f3a38bc1ba6838},
isbn = {978-2-8399-1844-2},
keywords = {dblp},
pages = {1-11},
publisher = {IEEE},
timestamp = {2020-01-18T11:40:22.000+0100},
title = {Measure twice and cut once: Robust dynamic voltage scaling for FPGAs.},
url = {http://dblp.uni-trier.de/db/conf/fpl/fpl2016.html#AhmedZTB16},
year = 2016
}