%0 Journal Article %1 journals/tii/AdlyAYATMJLI15 %A Adly, Fatima %A Alhussein, Omar %A Yoo, Paul D. %A Al-Hammadi, Yousof %A Taha, Kamal %A Muhaidat, Sami %A Jeong, Young-Seon %A Lee, Uihyoung %A Ismail, Mohammed %D 2015 %J IEEE Trans. Ind. Informatics %K dblp %N 6 %P 1267-1276 %T Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps. %U http://dblp.uni-trier.de/db/journals/tii/tii11.html#AdlyAYATMJLI15 %V 11

@article{journals/tii/AdlyAYATMJLI15, added-at = {2024-03-25T00:00:00.000+0100}, author = {Adly, Fatima and Alhussein, Omar and Yoo, Paul D. and Al-Hammadi, Yousof and Taha, Kamal and Muhaidat, Sami and Jeong, Young-Seon and Lee, Uihyoung and Ismail, Mohammed}, biburl = {https://www.bibsonomy.org/bibtex/2008e6191b6fe096859d7adabe0f65df9/dblp}, ee = {https://doi.org/10.1109/TII.2015.2481719}, interhash = {4d671f4e5f5647dde3ee1dd83dc6f218}, intrahash = {008e6191b6fe096859d7adabe0f65df9}, journal = {IEEE Trans. Ind. Informatics}, keywords = {dblp}, number = 6, pages = {1267-1276}, timestamp = {2024-04-08T15:02:06.000+0200}, title = {Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps.}, url = {http://dblp.uni-trier.de/db/journals/tii/tii11.html#AdlyAYATMJLI15}, volume = 11, year = 2015 }