%0 Conference Paper %1 conf/dft/SavanurAT15 %A Savanur, Puneet Ramesh %A Alladi, Phaninder %A Tragoudas, Spyros %B DFTS %D 2015 %I IEEE Computer Society %K dblp %P 123-126 %T A BIST approach for counterfeit circuit detection based on NBTI degradation. %U http://dblp.uni-trier.de/db/conf/dft/dft2015.html#SavanurAT15 %@ 978-1-4799-8606-4

@inproceedings{conf/dft/SavanurAT15, added-at = {2023-03-24T00:00:00.000+0100}, author = {Savanur, Puneet Ramesh and Alladi, Phaninder and Tragoudas, Spyros}, biburl = {https://www.bibsonomy.org/bibtex/2048371a3265e1984afe45a6ba7408d98/dblp}, booktitle = {DFTS}, crossref = {conf/dft/2015}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFT.2015.7315148}, interhash = {f2e6797d8412d3431914976716458be0}, intrahash = {048371a3265e1984afe45a6ba7408d98}, isbn = {978-1-4799-8606-4}, keywords = {dblp}, pages = {123-126}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:57:12.000+0200}, title = {A BIST approach for counterfeit circuit detection based on NBTI degradation.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2015.html#SavanurAT15}, year = 2015 }