%0 Conference Paper %1 conf/itc/ArabiK97a %A Arabi, Karim %A Kaminska, Bozena %B ITC %D 1997 %I IEEE Computer Society %K dblp %P 786-795 %T Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc1997.html#ArabiK97a %@ 0-7803-4209-7

@inproceedings{conf/itc/ArabiK97a, added-at = {2023-03-23T00:00:00.000+0100}, author = {Arabi, Karim and Kaminska, Bozena}, biburl = {https://www.bibsonomy.org/bibtex/2086d476fc6342af03267615d9da1da1f/dblp}, booktitle = {ITC}, crossref = {conf/itc/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1997.639692}, interhash = {89395f0a641db1c91aeb3bd369e8efec}, intrahash = {086d476fc6342af03267615d9da1da1f}, isbn = {0-7803-4209-7}, keywords = {dblp}, pages = {786-795}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:11.000+0200}, title = {Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1997.html#ArabiK97a}, year = 1997 }