%0 Conference Paper %1 conf/itc/MooreGBL00 %A Moore, Will R. %A Gronthoud, Guido %A Baker, Keith %A Lousberg, Maurice %B ITC %D 2000 %I IEEE Computer Society %K dblp %P 95-104 %T Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? %U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#MooreGBL00 %@ 0-7803-6546-1

@inproceedings{conf/itc/MooreGBL00, added-at = {2023-03-23T00:00:00.000+0100}, author = {Moore, Will R. and Gronthoud, Guido and Baker, Keith and Lousberg, Maurice}, biburl = {https://www.bibsonomy.org/bibtex/20bf26f3672d025d393a1d30076903a4e/dblp}, booktitle = {ITC}, crossref = {conf/itc/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894196}, interhash = {7cc7f15e370a3f562b00f142db1195bc}, intrahash = {0bf26f3672d025d393a1d30076903a4e}, isbn = {0-7803-6546-1}, keywords = {dblp}, pages = {95-104}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:46.000+0200}, title = {Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#MooreGBL00}, year = 2000 }