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Exploiting Wavelength Diversity for High Resolution Time-of-Flight 3D Imaging

, , , , and . IEEE Transactions on Pattern Analysis and Machine Intelligence, 43 (7): 2193-2205 (July 2021)
DOI: 10.1109/TPAMI.2021.3075156

Abstract

The poor lateral and depth resolution of state-of-the-art 3D sensors based on the time-of-flight (ToF) principle has limited widespread adoption to a few niche applications. In this work, we introduce a novel sensor concept that provides ToF-based 3D measurements of real world objects and surfaces with depth precision up to 35$m$μm and point cloud densities commensurate with the native sensor resolution of standard CMOS/CCD detectors (up to several megapixels). Such capabilities are realized by combining the best attributes of continuous wave ToF sensing, multi-wavelength interferometry, and heterodyne interferometry into a single approach. We describe multiple embodiments of the approach, each featuring a different sensing modality and associated tradeoffs.

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Exploiting Wavelength Diversity for High Resolution Time-of-Flight 3D Imaging | IEEE Journals & Magazine | IEEE Xplore

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