%0 Conference Paper %1 conf/ats/MizushimaSFMWMM16 %A Mizushima, Takeshi %A Shirahata, Kazuki %A Fujibe, Tasuku %A Matsumura, Hidenobu %A Watanabe, Daisuke %A Mineo, Hiroyuki %A Masuda, Shin %B ATS %D 2016 %I IEEE Computer Society %K dblp %P 130 %T An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production. %U http://dblp.uni-trier.de/db/conf/ats/ats2016.html#MizushimaSFMWMM16 %@ 978-1-5090-3809-1

@inproceedings{conf/ats/MizushimaSFMWMM16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Mizushima, Takeshi and Shirahata, Kazuki and Fujibe, Tasuku and Matsumura, Hidenobu and Watanabe, Daisuke and Mineo, Hiroyuki and Masuda, Shin}, biburl = {https://www.bibsonomy.org/bibtex/20c32dba55aee9bb22250b8032396e8b6/dblp}, booktitle = {ATS}, crossref = {conf/ats/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2016.51}, interhash = {8453e26c90c125e521cb9df8b2c1b82c}, intrahash = {0c32dba55aee9bb22250b8032396e8b6}, isbn = {978-1-5090-3809-1}, keywords = {dblp}, pages = 130, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:46.000+0200}, title = {An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2016.html#MizushimaSFMWMM16}, year = 2016 }