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%0 Conference Paper
%1 conf/vts/SpinnerPEBKC08
%A Spinner, Stefan
%A Polian, Ilia
%A Engelke, Piet
%A Becker, Bernd
%A Keim, Martin
%A Cheng, Wu-Tung
%B VTS
%D 2008
%I IEEE Computer Society
%K
%P 181-186
%T Automatic Test Pattern Generation for Interconnect Open Defects.
%U http://dblp.uni-trier.de/db/conf/vts/vts2008.html#SpinnerPEBKC08
%@ 978-0-7695-3123-6
@inproceedings{conf/vts/SpinnerPEBKC08,
added-at = {2023-12-12T19:27:13.000+0100},
author = {Spinner, Stefan and Polian, Ilia and Engelke, Piet and Becker, Bernd and Keim, Martin and Cheng, Wu-Tung},
biburl = {https://www.bibsonomy.org/bibtex/208ed24aacf6a6961267ec6e2832d2c72/admin},
booktitle = {VTS},
crossref = {conf/vts/2008},
ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.30},
interhash = {20f19b67c94acf7d4d1572b926a53a67},
intrahash = {08ed24aacf6a6961267ec6e2832d2c72},
isbn = {978-0-7695-3123-6},
keywords = {},
pages = {181-186},
publisher = {IEEE Computer Society},
timestamp = {2023-12-12T19:27:13.000+0100},
title = {Automatic Test Pattern Generation for Interconnect Open Defects.},
url = {http://dblp.uni-trier.de/db/conf/vts/vts2008.html#SpinnerPEBKC08},
year = 2008
}