%0 Journal Article %1 journals/mr/PelzerNZWLK12 %A Pelzer, Rainer %A Nelhiebel, Michael %A Zink, Robert %A Wöhlert, Stefan %A Lassnig, Alice %A Khatibi, Golta %D 2012 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1966-1970 %T High temperature storage reliability investigation of the Al-Cu wire bond interface. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#PelzerNZWLK12 %V 52

@article{journals/mr/PelzerNZWLK12, added-at = {2022-02-04T00:00:00.000+0100}, author = {Pelzer, Rainer and Nelhiebel, Michael and Zink, Robert and Wöhlert, Stefan and Lassnig, Alice and Khatibi, Golta}, biburl = {https://www.bibsonomy.org/bibtex/2141765aaa0389b929e1cba3f25d97086/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.06.070}, interhash = {89be834239bd7945c2082428cac3f8c8}, intrahash = {141765aaa0389b929e1cba3f25d97086}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1966-1970}, timestamp = {2024-04-09T02:50:36.000+0200}, title = {High temperature storage reliability investigation of the Al-Cu wire bond interface.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#PelzerNZWLK12}, volume = 52, year = 2012 }