%0 Conference Paper %1 conf/itc/Hoye86 %A Murphy-Hoye, Mary C. %B ITC %D 1986 %I IEEE Computer Society %K dblp %P 939-946 %T Artificial Intelligence in Semiconductor Manufacturing for Process Development, Functional Diagnostics, and Yield Crash Prevention. %U http://dblp.uni-trier.de/db/conf/itc/itc1986.html#Hoye86

@inproceedings{conf/itc/Hoye86, added-at = {2018-04-25T00:00:00.000+0200}, author = {Murphy-Hoye, Mary C.}, biburl = {https://www.bibsonomy.org/bibtex/217e37287386acbcbfdc32b9775b65682/dblp}, booktitle = {ITC}, crossref = {conf/itc/1986}, interhash = {ac0c9946fc3d147de56853dbcb5cb8e4}, intrahash = {17e37287386acbcbfdc32b9775b65682}, keywords = {dblp}, pages = {939-946}, publisher = {IEEE Computer Society}, timestamp = {2018-04-26T11:42:10.000+0200}, title = {Artificial Intelligence in Semiconductor Manufacturing for Process Development, Functional Diagnostics, and Yield Crash Prevention.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1986.html#Hoye86}, year = 1986 }