%0 Conference Paper %1 conf/itc/WrightS03 %A Wright, Derek %A Sachdev, Manoj %B ITC %D 2003 %I IEEE Computer Society %K dblp %P 39-47 %T Transistor-Level Fault Analysis and Test Algorithm Development for Ternary Dynamic Content Addressable Memorie. %U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#WrightS03 %@ 0-7803-8106-8

@inproceedings{conf/itc/WrightS03, added-at = {2023-03-23T00:00:00.000+0100}, author = {Wright, Derek and Sachdev, Manoj}, biburl = {https://www.bibsonomy.org/bibtex/2214631dd50604b5b688b3fd5e662950b/dblp}, booktitle = {ITC}, crossref = {conf/itc/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270823}, interhash = {e5617db9432cbd5350d0206fb53488e8}, intrahash = {214631dd50604b5b688b3fd5e662950b}, isbn = {0-7803-8106-8}, keywords = {dblp}, pages = {39-47}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:31.000+0200}, title = {Transistor-Level Fault Analysis and Test Algorithm Development for Ternary Dynamic Content Addressable Memorie.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#WrightS03}, year = 2003 }