The effect of program and model structure on mc/dc test adequacy coverage
A. Rajan, M. Whalen, and M. Heimdahl. ICSE '08: Proceedings of the 30th international conference on Software engineering, page 161--170. New York, NY, USA, ACM, (2008)MR: nuetzlich fuer IST-SPL nur wegen der Referenzen auf eingesetzte Techniken zur ' Test Case Generation using model checkers '..
DOI: http://doi.acm.org/10.1145/1368088.1368111
Abstract
In avionics and other critical systems domains, adequacy of test suites is currently measured using the MC/DC metric on source code (or on a model in model-based development). We believe that the rigor of the MC/DC metric is highly sensitive to the structure of the implementation and can therefore be misleading as a test adequacy criterion. We investigate this hypothesis by empirically studying the effect of program structure on MC/DC coverage. To perform this investigation, we use six realistic systems from the civil avionics domain and two toy examples. For each of these systems, we use two versions of their implementation-with and without expression folding (i.e., inlining). To assess the sensitivity of MC/DC to program structure, we first generate test suites that satisfy MC/DC over a non-inlined implementation. We then run the generated test suites over the inlined implementation and measure MC/DC achieved. For our realistic examples, the test suites yield an average reduction of 29.5% in MC/DC achieved over the inlined implementations at 5% statistical significance level.
%0 Conference Paper
%1 Rajan2008
%A Rajan, Ajitha
%A Whalen, Michael W.
%A Heimdahl, Mats P.E.
%B ICSE '08: Proceedings of the 30th international conference on Software engineering
%C New York, NY, USA
%D 2008
%I ACM
%K automated case checking generation model test
%P 161--170
%R http://doi.acm.org/10.1145/1368088.1368111
%T The effect of program and model structure on mc/dc test adequacy coverage
%U http://portal.acm.org/citation.cfm?id=1368088.1368111&coll=GUIDE&dl=GUIDE
%X In avionics and other critical systems domains, adequacy of test suites is currently measured using the MC/DC metric on source code (or on a model in model-based development). We believe that the rigor of the MC/DC metric is highly sensitive to the structure of the implementation and can therefore be misleading as a test adequacy criterion. We investigate this hypothesis by empirically studying the effect of program structure on MC/DC coverage. To perform this investigation, we use six realistic systems from the civil avionics domain and two toy examples. For each of these systems, we use two versions of their implementation-with and without expression folding (i.e., inlining). To assess the sensitivity of MC/DC to program structure, we first generate test suites that satisfy MC/DC over a non-inlined implementation. We then run the generated test suites over the inlined implementation and measure MC/DC achieved. For our realistic examples, the test suites yield an average reduction of 29.5% in MC/DC achieved over the inlined implementations at 5% statistical significance level.
%@ 978-1-60558-079-1
@inproceedings{Rajan2008,
abstract = {In avionics and other critical systems domains, adequacy of test suites is currently measured using the MC/DC metric on source code (or on a model in model-based development). We believe that the rigor of the MC/DC metric is highly sensitive to the structure of the implementation and can therefore be misleading as a test adequacy criterion. We investigate this hypothesis by empirically studying the effect of program structure on MC/DC coverage. To perform this investigation, we use six realistic systems from the civil avionics domain and two toy examples. For each of these systems, we use two versions of their implementation-with and without expression folding (i.e., inlining). To assess the sensitivity of MC/DC to program structure, we first generate test suites that satisfy MC/DC over a non-inlined implementation. We then run the generated test suites over the inlined implementation and measure MC/DC achieved. For our realistic examples, the test suites yield an average reduction of 29.5% in MC/DC achieved over the inlined implementations at 5% statistical significance level.},
added-at = {2008-05-21T11:42:25.000+0200},
address = {New York, NY, USA},
author = {Rajan, Ajitha and Whalen, Michael W. and Heimdahl, Mats P.E.},
biburl = {https://www.bibsonomy.org/bibtex/226d5fee01f752294f19fa61b6b4dab4e/ist_spl},
booktitle = {ICSE '08: Proceedings of the 30th international conference on Software engineering},
doi = {http://doi.acm.org/10.1145/1368088.1368111},
interhash = {6a0a2fea86fbe1d3122a61b17706fe00},
intrahash = {26d5fee01f752294f19fa61b6b4dab4e},
isbn = {978-1-60558-079-1},
keywords = {automated case checking generation model test},
location = {Leipzig, Germany},
note = {MR: nuetzlich fuer IST-SPL nur wegen der Referenzen auf eingesetzte Techniken zur ' Test Case Generation using model checkers '.},
pages = {161--170},
publisher = {ACM},
timestamp = {2008-05-21T11:42:25.000+0200},
title = {The effect of program and model structure on mc/dc test adequacy coverage},
url = {http://portal.acm.org/citation.cfm?id=1368088.1368111&coll=GUIDE&dl=GUIDE},
year = 2008
}