%0 Journal Article %1 killian2014smart %A Killian, C. %A Tanougast, C. %A Monteiro, F. %A Dandache, A. %D 2014 %J Very Large Scale Integration (VLSI) Systems, IEEE Transactions on %K fault noc reliable smart tolerant %N 2 %P 242-255 %R 10.1109/TVLSI.2013.2240324 %T Smart Reliable Network-on-Chip %U http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6468169&navigation=1 %V 22 %X In this paper, we present a new network-on-chip (NoC) that handles accurate localizations of the faulty parts of the NoC. The proposed NoC is based on new error detection mechanisms suitable for dynamic NoCs, where the number and position of processor elements or faulty blocks vary during runtime. Indeed, we propose online detection of data packet and adaptive routing algorithm errors. Both presented mechanisms are able to distinguish permanent and transient errors and localize accurately the position of the faulty blocks (data bus, input port, output port) in the NoC routers, while preserving the throughput, the network load, and the data packet latency. We provide localization capacity analysis of the presented mechanisms, NoC performance evaluations, and field-programmable gate array synthesis.

@article{killian2014smart, abstract = {In this paper, we present a new network-on-chip (NoC) that handles accurate localizations of the faulty parts of the NoC. The proposed NoC is based on new error detection mechanisms suitable for dynamic NoCs, where the number and position of processor elements or faulty blocks vary during runtime. Indeed, we propose online detection of data packet and adaptive routing algorithm errors. Both presented mechanisms are able to distinguish permanent and transient errors and localize accurately the position of the faulty blocks (data bus, input port, output port) in the NoC routers, while preserving the throughput, the network load, and the data packet latency. We provide localization capacity analysis of the presented mechanisms, NoC performance evaluations, and field-programmable gate array synthesis.}, added-at = {2014-10-15T17:57:25.000+0200}, author = {Killian, C. and Tanougast, C. and Monteiro, F. and Dandache, A.}, biburl = {https://www.bibsonomy.org/bibtex/226e6dca7f67cf15c2c0ed0fbc8e77bbe/eberle18}, description = {IEEE Xplore Abstract - Smart Reliable Network-on-Chip}, doi = {10.1109/TVLSI.2013.2240324}, interhash = {850cdae954bd2afff810ca9b4b8543e5}, intrahash = {26e6dca7f67cf15c2c0ed0fbc8e77bbe}, issn = {1063-8210}, journal = {Very Large Scale Integration (VLSI) Systems, IEEE Transactions on}, keywords = {fault noc reliable smart tolerant}, month = feb, number = 2, pages = {242-255}, timestamp = {2014-10-15T17:57:25.000+0200}, title = {Smart Reliable Network-on-Chip}, url = {http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6468169&navigation=1}, volume = 22, year = 2014 }