%0 Conference Paper %1 conf/glvlsi/YaoPR10 %A Yao, Bo %A Pomeranz, Irith %A Reddy, Sudhakar M. %B ACM Great Lakes Symposium on VLSI %D 2010 %E Bahar, R. Iris %E Lombardi, Fabrizio %E Atienza, David %E Brunvand, Erik %I ACM %K dblp %P 135-138 %T Deterministic broadside test generation for transition path delay faults. %U http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2010.html#YaoPR10 %@ 978-1-4503-0012-4

@inproceedings{conf/glvlsi/YaoPR10, added-at = {2018-11-06T00:00:00.000+0100}, author = {Yao, Bo and Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/237e663d70ee2db038975807166af21c3/dblp}, booktitle = {ACM Great Lakes Symposium on VLSI}, crossref = {conf/glvlsi/2010}, editor = {Bahar, R. Iris and Lombardi, Fabrizio and Atienza, David and Brunvand, Erik}, ee = {https://doi.org/10.1145/1785481.1785514}, interhash = {8d4b8470066e38badf3adb323eb75c1f}, intrahash = {37e663d70ee2db038975807166af21c3}, isbn = {978-1-4503-0012-4}, keywords = {dblp}, pages = {135-138}, publisher = {ACM}, timestamp = {2018-11-07T14:24:46.000+0100}, title = {Deterministic broadside test generation for transition path delay faults.}, url = {http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2010.html#YaoPR10}, year = 2010 }