%0 Conference Paper %1 conf/ats/IchiharaSYI09 %A Ichihara, Hideyuki %A Sutoh, Kenta %A Yoshikawa, Yuki %A Inoue, Tomoo %B Asian Test Symposium %D 2009 %I IEEE Computer Society %K dblp %P 171-176 %T A Practical Approach to Threshold Test Generation for Error Tolerant Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats2009.html#IchiharaSYI09 %@ 978-0-7695-3864-8

@inproceedings{conf/ats/IchiharaSYI09, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ichihara, Hideyuki and Sutoh, Kenta and Yoshikawa, Yuki and Inoue, Tomoo}, biburl = {https://www.bibsonomy.org/bibtex/2385eae7be467684c84efca976d8c3066/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2009.19}, interhash = {c65a11b58a5a936e9eaf652bd480f459}, intrahash = {385eae7be467684c84efca976d8c3066}, isbn = {978-0-7695-3864-8}, keywords = {dblp}, pages = {171-176}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:09.000+0200}, title = {A Practical Approach to Threshold Test Generation for Error Tolerant Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#IchiharaSYI09}, year = 2009 }