%0 Journal Article %1 journals/tcad/Konuk99 %A Konuk, Haluk %D 1999 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 12 %P 1768-1779 %T Voltage- and current-based fault simulation for interconnect open defects. %U http://dblp.uni-trier.de/db/journals/tcad/tcad18.html#Konuk99 %V 18

@article{journals/tcad/Konuk99, added-at = {2020-09-24T00:00:00.000+0200}, author = {Konuk, Haluk}, biburl = {https://www.bibsonomy.org/bibtex/23b3c7d8400f6d847124318a8a302e8f7/dblp}, ee = {https://doi.org/10.1109/43.811326}, interhash = {d3cf20a0aead849204e7e5d4cf83726d}, intrahash = {3b3c7d8400f6d847124318a8a302e8f7}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 12, pages = {1768-1779}, timestamp = {2020-09-25T11:45:09.000+0200}, title = {Voltage- and current-based fault simulation for interconnect open defects.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad18.html#Konuk99}, volume = 18, year = 1999 }