%0 Conference Paper %1 conf/dtis/BenvenutiBFCCPT19 %A Benvenuti, Lorenzo %A Bruschi, Paolo %A Fanucci, Luca %A Coppeta, Raffaele %A Carniello, Sara %A Piro, Luigi Di %A Tinfena, Francesco %B DTIS %D 2019 %I IEEE %K dblp %P 1-5 %T Modelling and measurements of thermomechanical stress induced drift on polysilicon resistors with different layout. %U http://dblp.uni-trier.de/db/conf/dtis/dtis2019.html#BenvenutiBFCCPT19 %@ 978-1-7281-3424-6

@inproceedings{conf/dtis/BenvenutiBFCCPT19, added-at = {2023-09-30T00:00:00.000+0200}, author = {Benvenuti, Lorenzo and Bruschi, Paolo and Fanucci, Luca and Coppeta, Raffaele and Carniello, Sara and Piro, Luigi Di and Tinfena, Francesco}, biburl = {https://www.bibsonomy.org/bibtex/23b6221f1b844ead8a55daca4c5d40055/dblp}, booktitle = {DTIS}, crossref = {conf/dtis/2019}, ee = {https://doi.org/10.1109/DTIS.2019.8734970}, interhash = {c487d49991dba3efdf89cc8127f297d2}, intrahash = {3b6221f1b844ead8a55daca4c5d40055}, isbn = {978-1-7281-3424-6}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-04-10T16:40:44.000+0200}, title = {Modelling and measurements of thermomechanical stress induced drift on polysilicon resistors with different layout.}, url = {http://dblp.uni-trier.de/db/conf/dtis/dtis2019.html#BenvenutiBFCCPT19}, year = 2019 }