%0 Conference Paper %1 conf/irps/BenoistDFAC15 %A Benoist, A. %A Denorme, S. %A Federspiel, X. %A Allard, Bruno %A Candelier, Philippe %B IRPS %D 2015 %I IEEE %K dblp %P 3 %T Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#BenoistDFAC15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/BenoistDFAC15, added-at = {2017-05-21T00:00:00.000+0200}, author = {Benoist, A. and Denorme, S. and Federspiel, X. and Allard, Bruno and Candelier, Philippe}, biburl = {https://www.bibsonomy.org/bibtex/2433123849ab85d8025af4f5c95efb82c/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112804}, interhash = {fae1db079c79778a895def3485209fad}, intrahash = {433123849ab85d8025af4f5c95efb82c}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 3, publisher = {IEEE}, timestamp = {2019-10-17T14:45:48.000+0200}, title = {Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#BenoistDFAC15}, year = 2015 }