%0 Journal Article %1 journals/ress/Davila-FriasYLY23 %A Davila-Frias, Alex %A Yodo, Nita %A Le, Trung %A Yadav, Om Prakash %D 2023 %J Reliab. Eng. Syst. Saf. %K dblp %P 108881 %T A deep neural network and Bayesian method based framework for all-terminal network reliability estimation considering degradation. %U http://dblp.uni-trier.de/db/journals/ress/ress229.html#Davila-FriasYLY23 %V 229

@article{journals/ress/Davila-FriasYLY23, added-at = {2022-12-25T00:00:00.000+0100}, author = {Davila-Frias, Alex and Yodo, Nita and Le, Trung and Yadav, Om Prakash}, biburl = {https://www.bibsonomy.org/bibtex/243977569b92ae143aec292d8060516b4/dblp}, ee = {https://doi.org/10.1016/j.ress.2022.108881}, interhash = {c07db67dd61e79a58a8cbbf59e72f4a1}, intrahash = {43977569b92ae143aec292d8060516b4}, journal = {Reliab. Eng. Syst. Saf.}, keywords = {dblp}, pages = 108881, timestamp = {2024-04-08T15:34:10.000+0200}, title = {A deep neural network and Bayesian method based framework for all-terminal network reliability estimation considering degradation.}, url = {http://dblp.uni-trier.de/db/journals/ress/ress229.html#Davila-FriasYLY23}, volume = 229, year = 2023 }