%0 Journal Article %1 journals/tcad/ChanSK02 %A Chan, Steven C. %A Shepard, Kenneth L. %A Kim, Dae-Jin %D 2002 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 8 %P 916-927 %T Static noise analysis for digital integrated circuits in partially depleted silicon-on-insulator technology. %U http://dblp.uni-trier.de/db/journals/tcad/tcad21.html#ChanSK02 %V 21

@article{journals/tcad/ChanSK02, added-at = {2020-09-24T00:00:00.000+0200}, author = {Chan, Steven C. and Shepard, Kenneth L. and Kim, Dae-Jin}, biburl = {https://www.bibsonomy.org/bibtex/24972cc15c0b87343cc32e498f2ac130f/dblp}, ee = {https://doi.org/10.1109/TCAD.2002.800461}, interhash = {2d90a9d7130a7e4758c2669ac99a87db}, intrahash = {4972cc15c0b87343cc32e498f2ac130f}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 8, pages = {916-927}, timestamp = {2020-09-25T11:46:43.000+0200}, title = {Static noise analysis for digital integrated circuits in partially depleted silicon-on-insulator technology.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad21.html#ChanSK02}, volume = 21, year = 2002 }