%0 Conference Paper %1 conf/ats/FukazawaIII13 %A Fukazawa, Yuki %A Iwagaki, Tsuyoshi %A Ichihara, Hideyuki %A Inoue, Tomoo %B Asian Test Symposium %D 2013 %I IEEE Computer Society %K dblp %P 85-90 %T A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test. %U http://dblp.uni-trier.de/db/conf/ats/ats2013.html#FukazawaIII13 %@ 978-0-7695-5080-0

@inproceedings{conf/ats/FukazawaIII13, added-at = {2023-03-24T00:00:00.000+0100}, author = {Fukazawa, Yuki and Iwagaki, Tsuyoshi and Ichihara, Hideyuki and Inoue, Tomoo}, biburl = {https://www.bibsonomy.org/bibtex/24bc4b1dbddcd38bc4ecc53926659698e/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2013}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2013.24}, interhash = {1fa0d1a4ce0ffa30a6deef6ac61441fb}, intrahash = {4bc4b1dbddcd38bc4ecc53926659698e}, isbn = {978-0-7695-5080-0}, keywords = {dblp}, pages = {85-90}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:09.000+0200}, title = {A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2013.html#FukazawaIII13}, year = 2013 }