%0 Journal Article %1 journals/et/AltetIW03 %A Altet, Josep %A Ivanov, André %A Wong, A. %D 2003 %J J. Electron. Test. %K dblp %N 3 %P 353-357 %T Thermal Testing of Analogue Integrated Circuits: A Case Study. %U http://dblp.uni-trier.de/db/journals/et/et19.html#AltetIW03 %V 19

@article{journals/et/AltetIW03, added-at = {2020-09-11T00:00:00.000+0200}, author = {Altet, Josep and Ivanov, André and Wong, A.}, biburl = {https://www.bibsonomy.org/bibtex/253193bdb4ab507947727f9ba6fb93327/dblp}, ee = {https://doi.org/10.1023/A:1023717617973}, interhash = {5f02b90bf1bcb9edd7af0988be68c4e8}, intrahash = {53193bdb4ab507947727f9ba6fb93327}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {353-357}, timestamp = {2020-09-12T11:40:15.000+0200}, title = {Thermal Testing of Analogue Integrated Circuits: A Case Study.}, url = {http://dblp.uni-trier.de/db/journals/et/et19.html#AltetIW03}, volume = 19, year = 2003 }