%0 Conference Paper %1 conf/essderc/EngstromPMH14 %A Engström, Olof %A Przewlocki, Henryk M. %A Mitrovic, Ivona Z. %A Hall, Stephen %B ESSDERC %D 2014 %I IEEE %K dblp %P 369-372 %T Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2014.html#EngstromPMH14 %@ 978-1-4799-4378-4

@inproceedings{conf/essderc/EngstromPMH14, added-at = {2017-06-15T00:00:00.000+0200}, author = {Engström, Olof and Przewlocki, Henryk M. and Mitrovic, Ivona Z. and Hall, Stephen}, biburl = {https://www.bibsonomy.org/bibtex/25ca77f84136f8804595fa5a69ffbbdf9/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2014}, ee = {https://doi.org/10.1109/ESSDERC.2014.6948837}, interhash = {1de35d7c7e8c1e2498b6de356883b957}, intrahash = {5ca77f84136f8804595fa5a69ffbbdf9}, isbn = {978-1-4799-4378-4}, keywords = {dblp}, pages = {369-372}, publisher = {IEEE}, timestamp = {2019-10-17T12:39:26.000+0200}, title = {Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2014.html#EngstromPMH14}, year = 2014 }