%0 Journal Article %1 journals/mr/YuanSZEDS07 %A Yuan, Cadmus A. %A van der Sluis, Olaf %A Zhang, G. Q. (Kouchi) %A Ernst, Leo J. %A van Driel, Willem D. %A van Silfhout, Richard B. R. %D 2007 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1483-1491 %T Molecular simulation on the material/interfacial strength of the low-dielectric materials. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#YuanSZEDS07 %V 47

@article{journals/mr/YuanSZEDS07, added-at = {2023-09-30T00:00:00.000+0200}, author = {Yuan, Cadmus A. and van der Sluis, Olaf and Zhang, G. Q. (Kouchi) and Ernst, Leo J. and van Driel, Willem D. and van Silfhout, Richard B. R.}, biburl = {https://www.bibsonomy.org/bibtex/25cf07bc62a3d13a9968bc80c0748aeb1/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.07.052}, interhash = {b316e732adee82da41b35bc9f7240016}, intrahash = {5cf07bc62a3d13a9968bc80c0748aeb1}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1483-1491}, timestamp = {2024-04-09T02:50:21.000+0200}, title = {Molecular simulation on the material/interfacial strength of the low-dielectric materials.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#YuanSZEDS07}, volume = 47, year = 2007 }